Laser meter of aerosol microparticles parameters during their spontaneous transformation

Authors

  • Vladimir Zemlyanskyi International Research and Training Center for Information Technologies and Systems under NAS and MES of Ukraine
  • Oleksandr Volkov International Research and Training Center for Information Technologies and Systems under NAS and MES of Ukraine
  • Michael Gusev International Research and Training Center for Information Technologies and Systems under NAS and MES of Ukraine

Keywords:

semiconductor laser, spatial antiphase filtering at two wavelengths, dual-frequency interference scheme, optical heterodensation

Abstract

A laser dual-wavelength analyzer microparticle (LDAM) based on the diagnostic method [1] is considered. Moving microparticles are irradiated by two pairs of coherent beams at long λ1 and λ2. The LDAM uses two anti-phase spatial filtering units of the scattered radiation at both wavelengths λ1, and λ2, whose outputs are connected to the inputs of a digital particle analyzer.

Additional Files

Published

2025-03-28

Issue

2024: XI Всесвітній конгрес “Авіація в XXI столітті” – “Безпека в авіації та космічні технології”

Section

Intellectual robotic and measuring systems