Ontological structure application for analysis and development of CISS

Authors

  • Олександр Євгенович Архипов National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"
  • Олег Віталійович Козленко National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

DOI:

https://doi.org/10.18372/2410-7840.19.11681

Keywords:

ontological structure, risk assessment, information leakage scenarios, information security culture, ontograph, information threat, information security culture level

Abstract

The article proposes ontological structure variant for analysis of CISS, which focuses on the most common information security leaks scenarios and information security culture. The analysis of CISS is based on many factors (attack scenarios on the system, etc.), many of which also depend not only on hardware elements. Common errors and misunderstanding of the security incidents definition and how to react also play an important role. So, for basic security system assessment evaluation, structure, that has determined factors and scenarios of CISS analysis for further use will greatly simplify understanding and automating processes of these evaluations. Proposed ontological structure can be used to determine average risk of information leakage scenarios and to determine information security culture level to specify overall formal security assessment of organization and, as such, to automate the process of determining this assessment.

Author Biographies

Олександр Євгенович Архипов, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

Professor, Doctor of Sciences in Eng., professor of the Department of Information Defense of National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute".

Олег Віталійович Козленко, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute"

PhD student of the Department of Information Defense, IPT, National Technical University of Ukraine "Igor Sikorsky Kyiv Polytechnic Institute".

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Published

2017-06-26

Issue

Section

Articles