STATSENKO, O. V.; SHYLIN, Y. L. INVERTER OF THE AUTOMATED SYSTEM FOR DETERMINING THE CHARACTERISTICS OF SEMICONDUCTOR DEVICES. Electronics and Control Systems, [S. l.], v. 2, n. 56, p. 92–98, 2018. DOI: 10.18372/1990-5548.56.12942. Disponível em: https://jrnl.nau.edu.ua/index.php/ESU/article/view/12942. Acesso em: 19 feb. 2026.